Published July 30, 2001
| Version v1
Journal article
Confinement-Enhanced Electron Transport across a Metal-Semiconductor Interface
Description
We present a combined scanning tunneling microscopy and ballistic electron emission microscopy study of electron transport across an epitaxial Pb/Si(111) interface. Experiments with a self-assembled Pb nanoscale wedge reveal the phenomenon of confinement-enhanced interfacial transport: a proportional increase of the electron injection rate into the semiconductor with the frequency of electron oscillations in the Pb quantum well
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 87
- Journal Issue
- 5
- Journal Page Range
- p. 056801-056801.4
- ISSN
- 0031-9007
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 32064231
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ELECTRON EMISSION; ELECTRONS; MICROSCOPY; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY; TRANSPORT
- Descriptors DEC
- ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; MICROSCOPY
Optional Information
- Notes
- Othernumber: PRLTAO000087000005056801000001; 001131PRL
- Funding organization
- (US)