Published July 30, 2001 | Version v1
Journal article

Confinement-Enhanced Electron Transport across a Metal-Semiconductor Interface

Description

We present a combined scanning tunneling microscopy and ballistic electron emission microscopy study of electron transport across an epitaxial Pb/Si(111) interface. Experiments with a self-assembled Pb nanoscale wedge reveal the phenomenon of confinement-enhanced interfacial transport: a proportional increase of the electron injection rate into the semiconductor with the frequency of electron oscillations in the Pb quantum well

Additional details

Publishing Information

Journal Title
Physical Review Letters
Journal Volume
87
Journal Issue
5
Journal Page Range
p. 056801-056801.4
ISSN
0031-9007

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
32064231
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ELECTRON EMISSION; ELECTRONS; MICROSCOPY; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY; TRANSPORT
Descriptors DEC
ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; MICROSCOPY

Optional Information

Notes
Othernumber: PRLTAO000087000005056801000001; 001131PRL
Funding organization
(US)