Published 2000 | Version v1
Journal article Metadata-only

X-ray graphic method for determination of thickness of subsurface deformed layers in single crystals

Creators

Description

The diffraction of X-rays in thick perfect single crystals with deformed subsurface layers is investigated. A method to obtain the X-ray topograms and to determine the thickness of these layers is proposed. 4 refs

Additional details

Additional titles

Original title (Russian)
Рентгенографический способ определения толщины приповерхностных деформированных слоев монокристаллов

Publishing Information

Journal Title
Izvestiya National'noj Akademii Nauk Armenii. Fizika
Journal Volume
35
Journal Issue
2
Journal Page Range
p. 100-105
ISSN
1025-5613

INIS

Country of Publication
Armenia
Country of Input or Organization
Armenia
INIS RN
33022595
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CALCULATION METHODS; LAYERS; MONOCRYSTALS; SURFACE AREA; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; SCATTERING; SURFACE PROPERTIES