Published April 2004 | Version v1
Journal article Metadata-only

The reflectance calibration of soft x-ray planar mirror with different grazing angle

Creators

  • 1. China Academy of Engineering Physics, Mianyang (China). Laser Fusion Research Center, State Key Laboratory of Laser Fusion
  • 2. Chinese Academy of Sciences, Beijing (China). Inst. of High Energy Physics, Synchrotron Radiation Laboratory
  • 3. Harbin Inst. of Technolog, Harbin (China). Dept. of Fine Mechanical Engineering

Description

The reflectivity of grazing soft x-ray planar mirror is studied. The Beijing Synchrotron Radiation Facility-3W1B beam line with beam current 40-120 mA, the storage ring electron energy 2 GeV, photon energy 50-1500 eV are used. The authors have improved the calibration method. The x-ray diode detectors of planar mirror facility are replaced by AXUV-100. Therefore, 2 to 3 orders of magnitude for the ratio of signal to noise can be increased, and the calibration region from (150-270 eV) to (50-1500 eV) is expanded. The reflectivity calibration curves for C, Si, Ni and Au planar mirror in different grazing angles are given. Finally, the values obtained in experiment and calculation are compared and analyzed

Additional details

Publishing Information

Journal Title
Acta Physica Sinica
Journal Volume
53
Journal Issue
4
Journal Page Range
p. 1099-1104
ISSN
1000-3290

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
36026773
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANGULAR CORRELATION; CALIBRATION; CHINA; MIRRORS; REFLECTIVITY; SIGNAL-TO-NOISE RATIO; SILICON DIODES; SOFT X RADIATION; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES
Descriptors DEC
ASIA; BREMSSTRAHLUNG; CORRELATIONS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SURFACE PROPERTIES; X RADIATION