TR and fluorescence study of organic nanostructures
- 1. Institute of Crystallography Russian Academy of Science (Russian Federation)
Description
The development of several x-ray scattering techniques based on total external fluorescence study and x-ray standing wave method is presented and used for characterization of organic nano-structures on the base of Langmuir-Blodgett films of fatty acid salts and phospholipids. Spectral selectivity of data obtained permits to detect alien interfacial layers and ions in organic structures, to get information about inter-diffusion at the interfaces, about ion permeation through organic bilayers - models of bio-membranes. The perspectives of investigation of protein - lipid bilayers on liquid surface by above mentioned techniques at SR source are discussed. Such study may allow to explore conformation structure and biological functions of membrane proteins and channel forming molecules in their native environment. The facilities of X-ray spectrometer designed and constructed for this purpose are presented. (author)
Additional details
Publishing Information
- Publisher
- Atominstitut der oesterreichischen Universitaeten, Technische Universitaet Wien
- Imprint Place
- Vienna (Austria)
- Imprint Title
- 8. conference on total reflection x-ray fluorescence analysis and related methods
- Imprint Pagination
- 108 p.
- Journal Page Range
- p. 55
Conference
- Title
- 8. conference on total reflection x-ray fluorescence analysis and related methods
- Dates
- 25-29 Sep 2000
- Place
- Vienna (Austria)
INIS
- Country of Publication
- Austria
- Country of Input or Organization
- Austria
- INIS RN
- 32022113
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BIOLOGICAL MATERIALS; FLUORESCENCE SPECTROSCOPY; ORGANIC COMPOUNDS; RADIATION SCATTERING ANALYSIS; SURFACES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; EMISSION SPECTROSCOPY; MATERIALS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; SCATTERING; SPECTROMETERS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS