Training effect in the hysteretic I-V curve

We observe the training effect in the hysteresis of current-voltage (I-V) curve for an Au/NiO/Au nanostructure. Training effect is described as a systematic change in current at a particular voltage when the applied voltage is successively cycled. We clearly demonstrate that training effect could be analyzed by a phenomenological relaxation model, suggesting that relaxation of the trapped charge carriers coupled to Au/NiO interface gives rise to the training effect where relaxation process is strongly influenced by the excitation of applied voltage.