Published April 2, 2010 | Version v1
Journal article

Evaluation of the film formation and the charge transport mechanism of indium tin oxide nanoparticle films

  • 1. Institute of Particle Technology, Friedrich-Alexander University Erlangen-Nuremberg, Cauerstr. 4, 91058 Erlangen (Germany)

Description

The structure formation and charge transfer of thin nanoparticulate indium tin oxide (ITO) films prepared by dip-coating was studied as a function of stabilizer before and after annealing at different temperatures. The analysis of the film structure by optical methods revealed that it is a function of the stability. Suspensions containing an optimum stabilizer concentration of 0.1 mol/l resulted in densely packed films with a peak specific conductivity of 8.3 S cm-1 after annealing at 550 oC for 1 h in air and 121 S cm-1 after annealing in forming gas at 250 oC for 1 h, respectively. Furthermore, for the densely packed films fluctuation-induced tunnelling was found to be the dominant charge transport mechanism, whereas for the low density films a thermally activated charge transport was observed. That the films of maximum density showed a metallic charge transport behaviour at temperatures above 300 K indicated the optimal contact between ITO particles had been achieved.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.10.119

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.10.119;
PII
S0040-6090(09)01765-9;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
518
Journal Issue
12
Journal Page Range
p. 3373-3381
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.