Effects of mechanical grinding and low temperature annealing on crystal structure of Er5Si4
Creators
- 1. Department of Materials Science and Engineering, Iowa State University, Ames, IA 50011-2300 (United States)
- 2. Ames Laboratory, Iowa State University, Ames, IA 50011-3020 (United States)
Description
Highlights: ► Impurity phases exist in orthorhombic Er5Si4:monoclinic 5:4, 1:1 and 5:3. ► Mechanical grinding induces transition from orthorhombic 5:4 to monoclinic 5:4. ► Low temperature annealing reverses the monoclinic 5:4 to orthorhombic 5:4. -- Abstract: The effect of mechanical grinding and subsequent low temperature annealing on the orthorhombic to monoclinic structural transition in the Er5Si4 compound was studied by X-ray powder diffraction using both a conventional laboratory Cu Kα1 radiation and a high-energy synchrotron source. A reversible phase transition from the orthorhombic to monoclinic structure occurs as a result of mechanical grinding. Low temperature annealing reverses the transformation and converts the formed monoclinic phase back to the orthorhombic, evidently by relieving residual stress introduced during the grinding
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2012.12.102Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2012.12.102;
- PII
- S0925-8388(12)02345-6;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 556
- Journal Page Range
- p. 127-134
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45041038
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; GRINDING; MONOCLINIC LATTICES; ORTHORHOMBIC LATTICES; PHASE TRANSFORMATIONS; RESIDUAL STRESSES; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; COMMINUTION; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; HEAT TREATMENTS; MACHINING; RADIATION SOURCES; RADIATIONS; SCATTERING; STRESSES
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.