Published 1991
| Version v1
Miscellaneous
Open
Thickness determination of metallic films by x-ray fluorescence spectrometry with wavelength dispersion
Description
Short communication
Availability note (English)
MF available from INIS under the Report Number.Files
24004718.pdf
Files
(37.5 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:e5e18b47ee1b1ec7b8a50797c1681334
|
37.5 kB | Preview Download |
Additional details
Additional titles
- Original title (Portuguese)
- Determinacao de espessura de filmes metalicos por espectrometria de fluorescencia de raios-x por dispersao de comprimento de onda
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- INIS-BR--3077
Conference
- Title
- 31. Brazilian Congress on Chemistry.
- Dates
- 21-25 Oct 1991.
- Place
- Recife, PE (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 24004718
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ALUMINIUM; EVAPORATION; GLASS; NICKEL; SUBSTRATES; THICKNESS; THIN FILMS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; DIMENSIONS; ELEMENTS; FILMS; METALS; NONDESTRUCTIVE ANALYSIS; PHASE TRANSFORMATIONS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS