Temperature characteristics research of SOI pressure sensor based on asymmetric base region transistor
- 1. Key Laboratory of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080 (China)
Description
Based on the asymmetric base region transistor, a pressure sensor with temperature compensation circuit is proposed in this paper. The pressure sensitive structure of the proposed sensor is constructed by a C-type silicon cup and a Wheatstone bridge with four piezoresistors (, , and locating on the edge of a square silicon membrane. The chip was designed and fabricated on a silicon on insulator (SOI) wafer by micro electromechanical system (MEMS) technology and bipolar transistor process. When the supply voltage is 5.0 V, the corresponding temperature coefficient of the sensitivity (TCS) for the sensor before and after temperature compensation are −1862 and −1067 ppm/°C, respectively. Through varying the ratio of the base region resistances and , the TCS for the sensor with the compensation circuit is −127 ppm/°C. It is possible to use this compensation circuit to improve the temperature characteristics of the pressure sensor. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/38/7/074008Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 38
- Journal Issue
- 7
- Journal Page Range
- [4 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51023216
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ASYMMETRY; DESIGN; ELECTRIC POTENTIAL; MEMS; SENSITIVITY; SENSORS; SILICON; TEMPERATURE COEFFICIENT; TRANSISTORS
- Descriptors DEC
- ELEMENTS; REACTIVITY COEFFICIENTS; SEMICONDUCTOR DEVICES; SEMIMETALS