Published December 2015
| Version v1
Journal article
X-ray photoelectron spectroscopy with Al and Cr K alpha X-ray sources
- 1. Kochi Univ. of Technology, Research Inst., Kami, Kochi (Japan)
- 2. National Inst. for Materials Science, Materials Analysis Station, Tsukuba, Ibaraki (Japan)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Hyomen Gijutsu
- Journal Volume
- 66
- Journal Issue
- 12
- Journal Page Range
- p. 608-613
- ISSN
- 0915-1869
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 47090531
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ADSORPTION; ENERGY-LEVEL TRANSITIONS; GALLIUM; MEASURING METHODS; SILICON OXIDES; SUBSTRATES; SURFACE PROPERTIES; THIN FILMS; X-RAY EQUIPMENT; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SOURCES; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELECTRON SPECTROSCOPY; ELEMENTS; EQUIPMENT; FILMS; METALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATION SOURCES; SILICON COMPOUNDS; SORPTION; SPECTROSCOPY; ZINC COMPOUNDS
Optional Information
- Notes
- 20 refs., 8 figs., 1 tab.