Published October 2006 | Version v1
Journal article

Real-Time 3D Profile Measurement Using Structured Light

  • 1. Department of Communication Engineering, Shanghai University (China)
  • 2. Department of Machinery and Automation Engineering, Shanghai University (China)

Description

The paper builds a real-time system of 3D profile measurement using structured-light imaging. It allows a hand-held object to rotate free in the space-time coded light field, which is projected by the projector. The surface of measured objects with projected coded light is imaged; the system shows surface reconstruction results of objects online. This feedback helps user to adjust object's pose in the light field according to the dismissed or error data, which would achieve the integrality of data used in reconstruction. This method can acquire denser data cloud and have higher reconstruction accuracy and efficiency. According to the real-time requirements, the paper presents the non-restricted light plane modelling which suits stripe structured light system, designs the three-frame stripes space-time coded pattern, and uses the advance ICP algorithms to acquire 3D data alignment from multiple view

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/48/339/jpconf6_48_063.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
48
Journal Issue
1
Journal Page Range
p. 339-343
ISSN
1742-6596

Conference

Title
International symposium on instrumentation science and technology
Dates
8-12 Aug 2006
Place
Harbin (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38033636
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; ALGORITHMS; ALIGNMENT; DESIGN; EFFICIENCY; ERRORS; FEEDBACK; REAL TIME SYSTEMS; SPACE-TIME; SURFACES; THREE-DIMENSIONAL CALCULATIONS; VISIBLE RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; MATHEMATICAL LOGIC; RADIATIONS