Published March 1985 | Version v1
Journal article

Fabrication of a miniaturized DCL or gate

  • 1. National Bureau of Standards, Electromagnetic Technology Division, Boulder, CO

Description

Using niobium edge junctions and electron beam lithography (EBL) the authors have made direct coupled logic (DCL) OR gates with 1 μm minimum line widths. The gate cell, containing an isolator and a buffer section, fits into an area of approximately 25 by 30 μm2. Our computer simulations show that these gates can have switching times of less than 10 ps. We have simulated the DCL circuit with several values of the most space-consuming element, an inductor. This paper describes the results of these simulations and presents a detailed description of the 7-level fabrication process. The mix of optical and electron-beam lithography used relies heavily on an inexpensive, yet powerful, circuit layout program

Additional details

Publishing Information

Journal Title
IEEE Trans. Magn.
Journal Volume
MAG-21
Journal Issue
2
Series
IEEE Trans. Magn.
Journal Page Range
846-849
ISSN
0018-9464
CODEN
IEMGA

Conference

Title
Applied superconductivity conference.
Dates
9-13 Sep 1984.
Place
San Diego, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17030175
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTERIZED SIMULATION; FABRICATION; GATING CIRCUITS; LOGIC CIRCUITS; NIOBIUM ALLOYS; PERFORMANCE; SUPERCONDUCTING JUNCTIONS; SURFACE FINISHING
Descriptors DEC
ALLOYS; ELECTRONIC CIRCUITS; SIMULATION

Optional Information

Secondary number(s)
CONF-840937--.