Published March 1985
| Version v1
Journal article
Fabrication of a miniaturized DCL or gate
Creators
- 1. National Bureau of Standards, Electromagnetic Technology Division, Boulder, CO
Description
Using niobium edge junctions and electron beam lithography (EBL) the authors have made direct coupled logic (DCL) OR gates with 1 μm minimum line widths. The gate cell, containing an isolator and a buffer section, fits into an area of approximately 25 by 30 μm2. Our computer simulations show that these gates can have switching times of less than 10 ps. We have simulated the DCL circuit with several values of the most space-consuming element, an inductor. This paper describes the results of these simulations and presents a detailed description of the 7-level fabrication process. The mix of optical and electron-beam lithography used relies heavily on an inexpensive, yet powerful, circuit layout program
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Magn.
- Journal Volume
- MAG-21
- Journal Issue
- 2
- Series
- IEEE Trans. Magn.
- Journal Page Range
- 846-849
- ISSN
- 0018-9464
- CODEN
- IEMGA
Conference
- Title
- Applied superconductivity conference.
- Dates
- 9-13 Sep 1984.
- Place
- San Diego, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17030175
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; FABRICATION; GATING CIRCUITS; LOGIC CIRCUITS; NIOBIUM ALLOYS; PERFORMANCE; SUPERCONDUCTING JUNCTIONS; SURFACE FINISHING
- Descriptors DEC
- ALLOYS; ELECTRONIC CIRCUITS; SIMULATION
Optional Information
- Secondary number(s)
- CONF-840937--.