Laser beam-profile monitor development at BNL for SNS
Creators
- 1. Brookhaven National Lab, Upton, NY (United States)
Description
A beam profile monitor for H- beams based on laser photoneutralization is being developed at Brookhaven National Laboratory (BNL) for use on the Spallation Neutron Source (SNS). An H- ion has a first ionization potential of 0.75eV and can be neutralized by light from a Nd:YAG laser (λ=1064nm). To measure beam profiles, a narrow laser beam is passed through the ion beam neutralizing a portion of the H- beam struck by the laser. The laser trajectory is stepped across the ion beam. At each laser position, the reduction of the beam current caused by the laser is measured. A proof-of-principle experiment was done earlier at 750keV. This paper reports on measurements made on 200MeV beam at BNL and with a compact scanner prototype at Lawrence Berkeley National Lab on beam from the SNS RFQ
Additional details
Identifiers
- DOI
- 10.1063/1.1524397;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 648
- Journal Issue
- 1
- Journal Page Range
- p. 150-161
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. beam instrumentation workshop
- Dates
- 6-9 May 2002
- Place
- Upton, NY (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36064704
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM CURRENTS; BEAM MONITORS; BEAM OPTICS; BEAM PROFILES; BNL; HYDROGEN IONS; ION BEAMS; IONIZATION POTENTIAL; LASER RADIATION; LASERS; NEUTRON BEAMS; NEUTRON SOURCES; SPALLATION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CURRENTS; ELECTROMAGNETIC RADIATION; IONS; MEASURING INSTRUMENTS; MONITORS; NATIONAL ORGANIZATIONS; NUCLEAR REACTIONS; NUCLEON BEAMS; PARTICLE BEAMS; PARTICLE SOURCES; RADIATION SOURCES; RADIATIONS; US AEC; US DOE; US ERDA; US ORGANIZATIONS
Optional Information
- Notes
- (c) 2002 American Institute of Physics