Published September 2008 | Version v1
Miscellaneous Open

XRF newsletter, No. 15, July 2008

Creators

Description

This periodical XRF Newsletter is to inform the XRF laboratories in IAEA Member States on recent developments in the field of XRF spectrometry and to exchange views on fundamental and applied aspects of sampling, sample preparation, instrumentation, quality control, etc. A few selected examples of the recent activities in the IAEA XRF Laboratory and its results in the field of XRF are presented: X-ray phase-contrast tomography based on synchrotron radiation sources; Advanced School on Synchrotron and Free-Electron Laser Sources and their Multidisciplinary Applications; European Conference on X-ray Spectrometry, EXRS2008; 9th International Art Conference, ART2008; Technical Meeting on Nuclear Spectrometric Methods for in situ Characterization of Materials

Availability note (English)

Available from INIS in electronic form; Also available on-line: http://www-pub.iaea.org/MTCD/publications/PDF/Newsletters/XRF-NL-15.pdf

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Additional details

Additional titles

Augmented title (English)
X-ray Fluorescence in the IAEA and its Member States

Identifiers

URL
http://www-pub.iaea.org/MTCD/publications/PDF/Newsletters/XRF-NL-15.pdf;

Publishing Information

Publisher
IAEA
Imprint Place
Vienna (Austria)
Imprint Pagination
20 p.
ISSN
1608-4632
Report number
INIS-XA--09N0205

INIS

Country of Publication
Austria
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40044965
Subject category
S99: GENERAL AND MISCELLANEOUS;
Is Lead record
Yes
Descriptors DEI
FREE ELECTRON LASERS; IAEA; MEETINGS; MEMBER STATES; QUALITY CONTROL; SAMPLE PREPARATION; SYNCHROTRON RADIATION SOURCES; TOMOGRAPHY; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY
Descriptors DEC
CHEMICAL ANALYSIS; CONTROL; DIAGNOSTIC TECHNIQUES; INTERNATIONAL ORGANIZATIONS; LASERS; NONDESTRUCTIVE ANALYSIS; RADIATION SOURCES; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information

Notes
Refs, figs, tabs, photos