Published 1988 | Version v1
Book

Interfacial structure, properties and design

  • 1. Oak Ridge National Lab., TN (USA)
  • 2. Ohio State Univ., Columbus, OH (USA)
  • 3. General Electric Co., Schenectady, NY (USA)

Description

These proceedings are organized in the order of presentation at the meeting, starting with the recent advances in structural characterization and analysis of internal interface and interphase boundaries. While the crystallographic theory of interfacial line defects had been established rigorously, its general applicability to mixed tilt and twist boundaries was questioned. The insights obtained from theoretical and experimental analyses of elasticity and localized deformation at interfaces relate directly to the intrinsic cohesive strength and intergranular fracture. Effects of processing on the grain boundary structure and chemistry of high Tc ceramic superconductors and the resulting changes in critical currents were established experimentally. A significant advancement was reported in processing and crystal growth techniques, which include the UHV diffusion bonding and MBE techniques for the controlled production of homo- and heterophase interfaces

Availability note (English)

Materials Research Society, 9800 Mc Knight Rd., Suite 327, Pittsburgh, PA 15237 (USA).

Additional details

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (USA)
ISBN
0-931837-92-8
Imprint Pagination
609 p.
Series
Materials Research Society symposium proceedings. Volume 122.

Conference

Title
Interfacial structure, properties and designs in solids.
Dates
5-9 Apr 1988.
Place
Reno, NV (USA).

Optional Information

Contract/Grant/Project number
Grant DMR8720419
Secondary number(s)
CONF-8804112--.