Challenge for real-time and real-space resolved spectroscopy of surface chemical reactions. Aiming at trace of irreversible and inhomogeneous reactions
Description
A novel experimental technique, time-resolved wavelength-dispersive soft X-ray imaging spectroscopy, is proposed in order to achieve real-time and real-space resolved spectroscopy for the observation of irreversible and inhomogeneous surface chemical reactions. By combining the wavelength-dispersed soft X rays, in which the X-ray wavelength (photon energy) changes as a function of position on the sample, with the photoelectron emission microscope, the soft X-ray absorption spectra are separately obtained at different positions on the sample without scanning the X-ray monochromator. Therefore, the real-time resolved measurement of site-selective soft X-ray absorption spectroscopy is realized in one event without repeating the chemical reaction. It is expected that the spatial distribution of different chemical species is traced during the surface chemical reaction, which is essential to understand the reaction mechanism. (author)
Availability note (English)
Available from http://dx.doi.org/10.1380/jsssj.36.309Additional details
Identifiers
- DOI
- 10.1380/jsssj.36.309;
Publishing Information
- Journal Title
- Hyomen Kagaku
- Journal Volume
- 36
- Journal Issue
- 6
- Journal Page Range
- p. 309-312
- ISSN
- 0388-5321
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 47051518
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER EFFECT; CHEMICAL REACTIONS; DIFFRACTION GRATINGS; EMISSION SPECTROSCOPY; FOCUSING; MICROSCOPY; NICKEL; OPTICAL SYSTEMS; REAL TIME SYSTEMS; SOFT X RADIATION; SPATIAL DISTRIBUTION; SPATIAL RESOLUTION; SURFACE AREA; X-RAY SPECTROSCOPY
- Descriptors DEC
- DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; RADIATIONS; RESOLUTION; SPECTROSCOPY; SURFACE PROPERTIES; TRANSITION ELEMENTS; X RADIATION
Optional Information
- Notes
- 4 refs., 4 figs.