Published December 2016
| Version v1
Journal article
Probe-diverse ptychography
Creators
- 1. ARC Centre of Excellence for Coherent X-ray Science, the University of Melbourne, School of Physics, Victoria 3010 (Australia)
- 2. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
- 3. London Centre for Nanotechnology, University College London, London WC1H 0AH (United Kingdom)
- 4. Research Complex at Harwell, Didcot, Oxfordshire OX11 0DE (United Kingdom)
Description
We propose an extension of ptychography where the target sample is scanned separately through several probes with distinct amplitude and phase profiles and a diffraction image is recorded for each probe and each sample translation. The resulting probe-diverse dataset is used to iteratively retrieve high-resolution images of the sample and all probes simultaneously. The method is shown to yield significant improvement in the reconstructed sample image compared to the image obtained using the standard single-probe ptychographic phase-retrieval scheme.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2016.08.003Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2016.08.003;
- PII
- S0304-3991(16)30121-8;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 171
- Journal Page Range
- p. 77-81
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48085969
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMPLITUDES; COMPARATIVE EVALUATIONS; DATASETS; DIFFRACTION; IMAGES; ITERATIVE METHODS; PROBES; RESOLUTION
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DOCUMENT TYPES; EVALUATION; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.