Published December 2016 | Version v1
Journal article

Probe-diverse ptychography

  • 1. ARC Centre of Excellence for Coherent X-ray Science, the University of Melbourne, School of Physics, Victoria 3010 (Australia)
  • 2. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
  • 3. London Centre for Nanotechnology, University College London, London WC1H 0AH (United Kingdom)
  • 4. Research Complex at Harwell, Didcot, Oxfordshire OX11 0DE (United Kingdom)

Description

We propose an extension of ptychography where the target sample is scanned separately through several probes with distinct amplitude and phase profiles and a diffraction image is recorded for each probe and each sample translation. The resulting probe-diverse dataset is used to iteratively retrieve high-resolution images of the sample and all probes simultaneously. The method is shown to yield significant improvement in the reconstructed sample image compared to the image obtained using the standard single-probe ptychographic phase-retrieval scheme.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2016.08.003

Additional details

Identifiers

DOI
10.1016/j.ultramic.2016.08.003;
PII
S0304-3991(16)30121-8;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
171
Journal Page Range
p. 77-81
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48085969
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
AMPLITUDES; COMPARATIVE EVALUATIONS; DATASETS; DIFFRACTION; IMAGES; ITERATIVE METHODS; PROBES; RESOLUTION
Descriptors DEC
CALCULATION METHODS; COHERENT SCATTERING; DOCUMENT TYPES; EVALUATION; SCATTERING

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.