Published May 1984 | Version v1
Journal article

EXAFS spectroscopy, from one perspective

Creators

  • 1. Xerox Palo Alto Research Center, CA (USA)

Description

The theory of extended X-ray absorption fine-structure (EXAFS) is presented in its simplest form so as to provide the basis for a discussion about the kind and quality of the structural information which can be extracted from EXAFS data

Additional details

Publishing Information

Journal Title
Nuovo Cim., D
Journal Volume
3
Journal Issue
5
Series
Nuovo Cim., D.
Journal Page Range
803-815
CODEN
NCSDD

INIS

Country of Publication
Italy
Country of Input or Organization
Italy
INIS RN
17052995
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CROSS SECTIONS; CRYSTAL STRUCTURE; FINE STRUCTURE; X-RAY SPECTROSCOPY
Descriptors DEC
SPECTROSCOPY