Published August 1992
| Version v1
Journal article
A 12 bit analog to digital converter for VLSI applications in nuclear science
Creators
- 1. Lawrence Berkeley Lab., CA (United States)
Description
This paper reports on a high density monolithic analog to digital converter (ADC) that has been designed and tested. The ADC features small silicon area and low power consumption for use in multichannel circuits for massively parallel particle physics detectors. The tested chip contains a linear ramp, precision high speed comparators, a pipelined counter, and double buffering storage latches fabricated in a 2 micron 2 polysilicon complementary metal-oxide-semiconductor (CMOS) technology. The prototype integrated circuit successfully combines digital frequencies in excess of 70 Mhz, with analog signals smaller than 1 mV. Test results show 1/4096 rms errors at conversion rates above 30 Khz, with less than 4 mW per channel power dissipation
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 39
- Journal Issue
- 4
- Journal Page Range
- p. 771-775.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- 1991 Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
- Dates
- 2-9 Nov 1991.
- Place
- Santa Fe, NM (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24033234
- Subject category
- S43: PARTICLE ACCELERATORS; S99: GENERAL AND MISCELLANEOUS; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATOR FACILITIES; ANALOG-TO-DIGITAL CONVERTERS; CHARGED PARTICLE DETECTION; DESIGN; DIGITAL SYSTEMS; INTEGRATED CIRCUITS; MOS TRANSISTORS; MULTI-CHANNEL ANALYZERS; PARALLEL PROCESSING; PERFORMANCE TESTING; RADIATION DETECTORS; SILICON
- Descriptors DEC
- DETECTION; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; MEASURING INSTRUMENTS; PROGRAMMING; PULSE ANALYZERS; RADIATION DETECTION; SEMICONDUCTOR DEVICES; SEMIMETALS; TESTING; TRANSISTORS
Optional Information
- Secondary number(s)
- CONF-911106--.