Physical properties of LaCo0.9Nb0.1O3 thin films grown by pulsed laser deposition
- 1. Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi -110016 (India)
Description
Here, we examine the physical properties of LaCo0.9Nb0.1O3 (LCNO) thin films grown on the Si (100) substrate by pulsed laser deposition. We used the KrF excimer laser (λ=248 nm) and the films are grown at the substrate temperatures of 750°C and 700°C with the energy density of ∼1.1 J/cm2. The oxygen partial pressure of 2.5×10-1 mbar was maintained during the deposition and slow cooling. The room temperature XRD data show the peaks from the silicon substrate and the (00l) planes of grown LCNO films, which indicate that these films are well ordered. The Raman measurements of all the samples show the peak at ∼640 cm-1, which is attributed to the A2g breathing in the LCNO system. We study the effect of different parameters on the structural and magnetic properties of LCNO films grown on different substrates. (author)
Additional details
Publishing Information
- Publisher
- CSIR-National Physical Laboratory
- Imprint Place
- New Delhi (India)
- Imprint Title
- Proceedings of the seventeenth international conference on thin films: abstracts
- Imprint Pagination
- 236 p.
- Journal Page Range
- p. 100
Conference
- Title
- 17. international conference on thin films
- Acronym
- ICTF-2017
- Dates
- 13-17 Nov 2017
- Place
- New Delhi (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 52048061
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COATINGS; CRYSTALLOGRAPHY; DEPOSITION; EXCIMER LASERS; LANTHANUM OXIDES; NIOBIUM OXIDES; STRUCTURAL CHEMICAL ANALYSIS; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; FILMS; GAS LASERS; LANTHANUM COMPOUNDS; LASERS; NIOBIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; REFRACTORY METAL COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS