Published March 10, 1987 | Version v1
Patent

Molecular gas analysis by Raman scattering in intracavity laser configuration

Description

A system is described for the near simultaneous analysis and quantitation of selected multiple polyatomic gases in a gas sample by Raman light scattering comprising in combination: (a) laser means capable of producing a polarized laser beam of a selected wavelength containing a laser cavity the laser cavity containing a plasma tube and wherein one end of the laser cavity contains a high reflectivity output coupler mirror; (b) a gas sampling cell located within the laser cavity between the plasma tube and the output coupler mirror, the cell having opposing parallel end windows interconnected by a continuous sidewall. The end windows and sidewall define a longitudinal gas chamber oriented such that, when the laser beam is activated, the laser beam is coincident with and traverses the axis of the longitudinal gas chamber, the end windows being positioned to be substantially normal to the axis of the longitudinal gas cell chamber. The cell also has opposing, aligned side windows in the sidewall parallel to and on either side of the axis of the longitudinal gas chamber. The gas cell further contains inlet and outlet means communicating with the chamber to pass a sample gas through the cell

Availability note (English)

U.S. Commissioner of Patents, Washington, D.C. 20231, USA, $.50.

Additional details

Publishing Information

Imprint Pagination
vp.
IPC:
Int. Cl. G01J 3/44.
IPC
Int. Cl. G01J 3/44.
Patent number
US patent document 4,648,714/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18064038
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ALIGNMENT; FREQUENCY RANGE; GAS ANALYSIS; GASES; LASER CAVITIES; LASER MIRRORS; LASERS; LENSES; OPTICAL FILTERS; PLASMA; POLARIZED BEAMS; POSITIONING; RAMAN EFFECT; RAMAN SPECTROSCOPY; REFLECTION; SAMPLING; SCATTERING; SPECIFICATIONS; TUBES; VISIBLE RADIATION
Descriptors DEC
AMPLIFIERS; BEAMS; ELECTROMAGNETIC RADIATION; EQUIPMENT; FILTERS; FLUIDS; LASER SPECTROSCOPY; RADIATIONS; SPECTROSCOPY