Published March 2013 | Version v1
Journal article

Effects of the randomly distributed magnetic field on the phase diagrams of the transverse Ising thin film

  • 1. Department of Physics, Dokuz Eylül University, Tr-35160 İzmir (Turkey)

Description

The effect of the random magnetic fields distributed by a Gaussian distribution centered at zero on the phase diagrams and ground state magnetizations of the transverse Ising thin film has been investigated. As a formulation, the differential operator technique and decoupling approximation within the effective field theory have been used. The variation of the phase diagrams with the Gaussian distribution width (σ) has been obtained and particular attention has been paid on the evolution of the special point coordinate with distribution parameter. In addition, the ground state longitudinal and transverse magnetization behaviors have been investigated in detail. - Highlights: ► We give the phase diagrams of the transverse Ising thin film under the randomly Gaussian distributed magnetic field. ► Evolution of the special point with Gaussian distribution width obtained. ► Behavior of longitudinal and transverse ground state magnetizations with Gaussian distribution width investigated.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2012.10.034

Additional details

Identifiers

DOI
10.1016/j.jmmm.2012.10.034;
arXiv
arXiv:1209.3952v1;
PII
S0304-8853(12)00856-6;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
329
Journal Page Range
p. 178-187
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44109707
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
APPROXIMATIONS; DECOUPLING; DISTRIBUTION; FIELD THEORIES; GAUSS FUNCTION; GROUND STATES; MAGNETIC FIELDS; MAGNETIZATION; PHASE DIAGRAMS; THIN FILMS
Descriptors DEC
CALCULATION METHODS; DIAGRAMS; ENERGY LEVELS; FILMS; FUNCTIONS; INFORMATION

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.