Calibration of the z-axis for large-scale scanning white-light interferometers
- 1. R and D Polytec GmbH, Polytec-Platz 1-7, 76137 Waldbronn (Germany)
- 2. eumetron GmbH, Gartenstrasse 133, 73430 Aalen (Germany)
Description
The calibration of white-light interferometers is an important requirement to make the results of these fast and accurate measurement tools comparable to the well-established tactile techniques. In this paper we present an approach for the calibration of the z-axis of a large-scale scanning white-light interferometer (SWLI) covering the full scanning range by utilizing a newly developed step-height calibration standard. The standard was specially adapted to the requirements of the large-scale WLI with an x-y-field of view of 38 x 28 mm2 and a z-scan range of 70 mm. We have developed a new procedure to calibrate the z-scale by using the measured WLI data of the step heights of the standard to obtain an inverse characteristic to compensate non-linearities of the length reference, which is in our case simply the lead screw of the step-motor-driven linear stage. We describe the development of our standard, present measurement results before and after the calibration and discuss the uncertainties of the procedure.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/311/1/012027Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 311
- Journal Issue
- 1
- Journal Page Range
- [7 p.]
- ISSN
- 1742-6596
Conference
- Title
- 13. international conference on metrology and properties of engineering surfaces
- Dates
- 12-15 Apr 2011
- Place
- Twickenham (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43071445
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; CALIBRATION STANDARDS; ENGINEERING; FASTENERS; INTERFEROMETERS; MEASURING METHODS; TOOLS; VISIBLE RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; EQUIPMENT; MEASURING INSTRUMENTS; RADIATIONS; STANDARDS