Published April 27, 2015
| Version v1
Journal article
Probing magnetic and electric optical responses of silicon nanoparticles
Creators
- 1. ITMO University, St. Petersburg 197101 (Russian Federation)
- 2. School of Electrical Engineering, Tel Aviv University, Ramat Aviv, Tel Aviv 69978 (Israel)
- 3. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576 (Singapore)
- 4. Data Storage Institute, A*STAR (Agency for Science Technology and Research), Singapore 117608 (Singapore)
- 5. Nonlinear Physics Centre, Research School of Physics and Engineering, Australian National University, Canberra ACT 2601 (Australia)
Description
We study experimentally both magnetic and electric optically induced resonances of silicon nanoparticles by combining polarization-resolved dark-field spectroscopy and near-field scanning optical microscopy measurements. We reveal that the scattering spectra exhibit strong sensitivity of electric dipole response to the probing beam polarization and attribute the characteristic asymmetry of measured near-field patterns to the excitation of a magnetic dipole mode. The proposed experimental approach can serve as a powerful tool for the study of photonic nanostructures possessing both electric and magnetic optical responses
Additional details
Identifiers
- DOI
- 10.1063/1.4919536;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 106
- Journal Issue
- 17
- Journal Page Range
- p. 171110-171110.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46104648
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ASYMMETRY; ELECTRIC DIPOLES; ENERGY SPECTRA; EXCITATION; MAGNETIC DIPOLES; NANOPARTICLES; NANOSTRUCTURES; POLARIZATION; PROBES; SCANNING LIGHT MICROSCOPY; SCATTERING; SENSITIVITY; SILICON
- Descriptors DEC
- DIPOLES; ELEMENTS; ENERGY-LEVEL TRANSITIONS; MICROSCOPY; MULTIPOLES; OPTICAL MICROSCOPY; PARTICLES; SEMIMETALS; SPECTRA
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC