Published July 1996
| Version v1
Journal article
Determination of the diffusion profile of the sodium oxide in silica refractories in glass melting furnaces
Creators
- 1. Companhia Vidraria Santa Marina, Sao Paulo, SP (Brazil)
Description
The identification of corrosive agents and corrosion mechanisms is necessary to increase the furnaces campaign. Silica refractories installed in 'Santa Marina' glass furnace crown were studied. X-ray fluorescence technique was used to determine the corrosive agents diffusion, which are present in the furnace atmosphere, leading to the formation of low melting temperature phases, causing the matrix glassing. Another interesting aspect was observed in the iron oxide/refractories color relation, according to its deepness. Hg porosimetry and X-ray Diffraction were also used to evaluate the microstructural variation and phase changes. (author)
Additional details
Additional titles
- Original title (Portuguese)
- Determinacao do perfil de difusao de oxido de sodio em refratarios de silica em fornos de fusao de vidro
Publishing Information
- Journal Title
- Ceramica
- Journal Volume
- 42
- Journal Issue
- 276
- Journal Page Range
- p. 368-371
- ISSN
- 0366-6913
Conference
- Title
- 40. Brazilian congress on ceramics; 1. Congress on ceramics of MERCOSUL
- Original Conference Title
- 40. congresso brasileiro de ceramica
- Dates
- 12-15 Jun 1996
- Place
- Criciuma, SC (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 29057520
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERAMICS; COMBUSTION; CORROSION; CORROSION PROTECTION; FUELS; FURNACES; GLASS; IRON OXIDES; LIFETIME; MELTING; MICROSTRUCTURE; OXYGEN; PHASE STUDIES; POROSITY; REFRACTORIES; SILICON OXIDES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; IRON COMPOUNDS; NONDESTRUCTIVE ANALYSIS; NONMETALS; OXIDATION; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; SCATTERING; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 2 refs., 7 figs.