Published 1989
| Version v1
Book
Time-resolved x-ray absorption spectroscopy
Creators
- 1. LURE (Lab. CNRS, CEA, MEN) Baat. 209D, 91405 Orsay Cedex (France)
- 2. Physique des Milieux Condeses (C.N.R.S.-U.A. 782), Universite P ampersand M Curie, T13 E4, 4 place Jussieu, F-75252 Paris Cedex 05 (France)
Description
X-ray Absorption Spectroscopy has proved to be a powerful tool to elucidate a huge number of questions in materials science. The authors discuss their interest in time-resolved experiments achieved with extreme energy resolution and energy scale stability to take a full benefit of the strong correlation between the stereochemical environment of the absorbing atom and the exact shape and position of the absorption edge. Fast energy dispersive x-ray spectroscopy allows in-situ observations with data collected in a short time. The main limitation concerns very low-concentration samples since it is no longer possible to use the dispersive geometry because detection of the signal via the decay channels is no more possible
Additional details
Additional titles
- Subtitle (English)
- Strengths and limitations
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 1-55899-016-X
- Imprint Title
- Synchrotron radiation in materials research
- Imprint Pagination
- 304 p.
- Series
- Materials Research Society symposium proceedings. Volume 143.
- Journal Page Range
- p. 121-132.
Conference
- Title
- SERI polycrystalline silicon solar cells topical review on high efficiency.
- Dates
- 10 Dec 1981.
- Place
- Washington, DC (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21052145
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ATOMS; EDGE DISLOCATIONS; GEOMETRY; MATERIALS; X-RAY SPECTRA
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISLOCATIONS; LINE DEFECTS; MATHEMATICS; SPECTRA; SPECTROSCOPY
Optional Information
- Secondary number(s)
- CONF-811224--.