Published 1989 | Version v1
Book

Time-resolved x-ray absorption spectroscopy

  • 1. LURE (Lab. CNRS, CEA, MEN) Baat. 209D, 91405 Orsay Cedex (France)
  • 2. Physique des Milieux Condeses (C.N.R.S.-U.A. 782), Universite P ampersand M Curie, T13 E4, 4 place Jussieu, F-75252 Paris Cedex 05 (France)

Description

X-ray Absorption Spectroscopy has proved to be a powerful tool to elucidate a huge number of questions in materials science. The authors discuss their interest in time-resolved experiments achieved with extreme energy resolution and energy scale stability to take a full benefit of the strong correlation between the stereochemical environment of the absorbing atom and the exact shape and position of the absorption edge. Fast energy dispersive x-ray spectroscopy allows in-situ observations with data collected in a short time. The main limitation concerns very low-concentration samples since it is no longer possible to use the dispersive geometry because detection of the signal via the decay channels is no more possible

Additional details

Additional titles

Subtitle (English)
Strengths and limitations

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (USA)
ISBN
1-55899-016-X
Imprint Title
Synchrotron radiation in materials research
Imprint Pagination
304 p.
Series
Materials Research Society symposium proceedings. Volume 143.
Journal Page Range
p. 121-132.

Conference

Title
SERI polycrystalline silicon solar cells topical review on high efficiency.
Dates
10 Dec 1981.
Place
Washington, DC (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21052145
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; ATOMS; EDGE DISLOCATIONS; GEOMETRY; MATERIALS; X-RAY SPECTRA
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISLOCATIONS; LINE DEFECTS; MATHEMATICS; SPECTRA; SPECTROSCOPY

Optional Information

Secondary number(s)
CONF-811224--.