Investigation of creep threshold stresses using in situ TEM straining experiment in an Al-5Y2O3-10SiC composite
Creators
- 1. Department of Materials Science and Engineering, Missouri University of Science and Technology, Rolla, MO 65409 (United States)
- 2. Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, IL 61801 (United States)
Description
Creep behavior of metal matrix composites is similar to dispersion strengthen alloys and characterized by the presence of a threshold stress below which the creep rate is negligible. This threshold stress is attributed, at least in dispersion-strengthened alloys, to dislocation particle interactions in which the detachment of the dislocations from the particle is the rate-limiting step. Creep experiments were performed on an Al-5Y2O3-10SiC composite in the temperature range of 473 and 573 K and the nature of the dislocation-particle interaction was determined by performing in situ straining experiments at elevated temperature in a transmission electron microscope. The threshold stress and the detachment stress are temperature dependent and the detachment stress is less than the threshold stress emphasizing the contribution of load transfer from the matrix to the reinforcement phase.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2009.12.015Additional details
Identifiers
- DOI
- 10.1016/j.msea.2009.12.015;
- PII
- S0921-5093(09)01318-5;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 527
- Journal Issue
- 9
- Journal Page Range
- p. 2390-2397
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44010092
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; COMPOSITE MATERIALS; CREEP; DISLOCATIONS; MATRIX MATERIALS; PARTICLES; SILICON CARBIDES; STRESSES; TEMPERATURE DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM OXIDES
- Descriptors DEC
- ALLOYS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; LINE DEFECTS; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.