Published 1972
| Version v1
Report
Open
Trace determination in semiconductors using neutron activation analysis
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
4053006.pdf
Files
(1.0 MB)
| Name | Size | Download all |
|---|---|---|
|
md5:5f3876cef73eb4fedd6d9528bff71868
|
1.0 MB | Preview Download |
Additional details
Additional titles
- Original title (French)
- Determinations de traces dans les semi-conducteurs par activation neutronique
Publishing Information
- Imprint Pagination
- 22 p.
- Report number
- INIS-mf--608
Conference
- Title
- International colloquium on the activation analysis of micro-quantities of elements in very high-purity inorganic and organic substances and in biological media.
- Dates
- 02 Oct 1972.
- Place
- Saclay, France.
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 4053006
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ACTIVATION ANALYSIS; ANTIMONY; ARSENIC; CHROMIUM; COBALT; COPPER; GALLIUM; GAMMA SPECTROSCOPY; GERMANIUM; GOLD; HAFNIUM; IMPURITIES; INDIUM; IRIDIUM; MERCURY; MULTI-ELEMENT ANALYSIS; MULTI-ELEMENT SEPARATION; NEUTRON BEAMS; NICKEL; SCANDIUM; SELENIUM; SEMICONDUCTOR MATERIALS; SENSITIVITY; SILVER; TANTALUM; TIN; URANIUM; ZINC
- Descriptors DEC
- ACTINIDES; BEAMS; CHEMICAL ANALYSIS; ELEMENTS; METALS; NUCLEON BEAMS; PARTICLE BEAMS; SEMIMETALS; SEPARATION PROCESSES; SPECTROSCOPY; TRANSITION ELEMENTS