Published May 1, 2007
| Version v1
Journal article
Experimental comparison of exchange bias measurement methodologies
- 1. Department of Electrical and Computer Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, Pennsylvania 19130 (United States)
- 2. Hitachi Global Storage Technologies, San Jose Research Center, 3403 Yerba Buena Road, San Jose, California 95135 (United States)
- 3. Department of Electrical and Computer Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, Pennsylvania 19104 (United States)
Description
Measurements performed on all-ferromagnetic bilayer systems and supported by model calculation results are used to compare different exchange bias characterization methods. We demonstrate that the accuracy of the conventional two-point technique based on measuring the sum of the coercive fields depends on the symmetry properties of hysteresis loops. On the other hand, the recently proposed center of mass method yields results independent of the hysteresis loop type and coincides with the two-point measurement only if the loops are symmetric. Our experimental and simulation results clearly demonstrate a strong correlation between loop asymmetry and the difference between these methods
Additional details
Identifiers
- DOI
- 10.1063/1.2711713;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 101
- Journal Issue
- 9
- Journal Page Range
- p. 09E515-09E515.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
Conference
- Title
- 10. joint MMM/INTERMAG conference
- Dates
- 7-11 Jan 2007
- Place
- Baltimore, MD (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39011611
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CENTER-OF-MASS SYSTEM; COERCIVE FORCE; COMPARATIVE EVALUATIONS; EXCHANGE INTERACTIONS; FERROMAGNETIC MATERIALS; HYSTERESIS; LAYERS; MEASURING METHODS; SIMULATION
- Descriptors DEC
- EVALUATION; INTERACTIONS; MAGNETIC MATERIALS; MATERIALS
Optional Information
- Notes
- (c) 2007 American Institute of Physics