Published May 1, 2007 | Version v1
Journal article

Experimental comparison of exchange bias measurement methodologies

  • 1. Department of Electrical and Computer Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, Pennsylvania 19130 (United States)
  • 2. Hitachi Global Storage Technologies, San Jose Research Center, 3403 Yerba Buena Road, San Jose, California 95135 (United States)
  • 3. Department of Electrical and Computer Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, Pennsylvania 19104 (United States)

Description

Measurements performed on all-ferromagnetic bilayer systems and supported by model calculation results are used to compare different exchange bias characterization methods. We demonstrate that the accuracy of the conventional two-point technique based on measuring the sum of the coercive fields depends on the symmetry properties of hysteresis loops. On the other hand, the recently proposed center of mass method yields results independent of the hysteresis loop type and coincides with the two-point measurement only if the loops are symmetric. Our experimental and simulation results clearly demonstrate a strong correlation between loop asymmetry and the difference between these methods

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
101
Journal Issue
9
Journal Page Range
p. 09E515-09E515.3
ISSN
0021-8979
CODEN
JAPIAU

Conference

Title
10. joint MMM/INTERMAG conference
Dates
7-11 Jan 2007
Place
Baltimore, MD (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39011611
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CENTER-OF-MASS SYSTEM; COERCIVE FORCE; COMPARATIVE EVALUATIONS; EXCHANGE INTERACTIONS; FERROMAGNETIC MATERIALS; HYSTERESIS; LAYERS; MEASURING METHODS; SIMULATION
Descriptors DEC
EVALUATION; INTERACTIONS; MAGNETIC MATERIALS; MATERIALS

Optional Information

Notes
(c) 2007 American Institute of Physics