Published 1983 | Version v1
Book

A packaged pyrometer for high temperature gases

  • 1. Stanford University, Stanford, CA

Description

A packaged, automated instrument for temperature measurement in high temperature gases has been developed. The instrument is based on the well established method of spectroscopic emission-absorption pyrometry or line reversal. The instrument is intended for use with gases seeded with alkali metals in the temperature range 2000-3000K. Provision has been made for simultaneous measurements at multiple wavelengths, which extends its use to the case of flows containing scattering particulates. The basic measurement is made by transilluminating the gas with radiation from a calibrated tungsten lamp of known brightness temperature. The signal from the lamp plus gas emission together with that from the gas alone and that from the reference lamp are brought sequentially to a spectrally selective detector. The gas temperature is then calculated, using the second radiation constant and the measurement wavelength which is chosen on or close to an absorption line, such that the optical depth is less than or equal to 1. An analysis has been made to extend this method to compensate for the presence of scattering particulates, and also to measure the particle temperature

Additional details

Publishing Information

Publisher
IEEE.
Imprint Place
New York, NY (USA)
Imprint Title
1983 IEEE international conference on plasma science
Journal Page Range
p. 14.

Conference

Title
IEEE international conference on plasma science.
Dates
25-27 May 1983.
Place
San Diego, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17074982
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; ALKALI METALS; EMISSION SPECTROSCOPY; LIGHT SOURCES; OPTICAL PYROMETERS; PLASMA DIAGNOSTICS; PYROMETERS; TEMPERATURE MEASUREMENT; VERY HIGH TEMPERATURE; VISIBLE RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; MEASURING INSTRUMENTS; METALS; RADIATION SOURCES; RADIATIONS; SPECTROSCOPY

Optional Information

Notes
Imprint:Abstracts Only.