Published July 2012 | Version v1
Journal article

Effect of the screening on the polaron mass in a semiconductor hollow nanocylinder

  • 1. Inst. of Physics, National Academy of Sciences of Azerbaijan, Javida str. 33, AZ-1143, Baku (Azerbaijan)

Description

The effect of the screening effect of the electron-phonon interaction on a weakly coupling Frohlich polaron mass has been investigated in a semiconductor hollow nanocylinder (HNC). General analytical expressions for the polaron mass have been obtained in arbitrary values of nanocylinder radius r0, taking into account screening as well as considering transitions between the subbands of dimensional quantization. The dependence of the polaron mass for the ground and excited states on nanocylinder radius has been represented on the basis of our numerical calculations. According to research carried out, it has been established that the screening contribution to polaron mass taking into account the virtual transitions from the ground state to subbands n = ±1, ±2, ±3, as well as the transitions from the polaron excited state with n = 1 to subbands n = -1, ±2, ±3, is significant for a = r0/rp values, where rp is the polaron radius. For values of the parameter a > 1 the screening contribution to polaron mass decreases with increasing r0, but the decrease of the polaron correction to the mass due to screening is still more than 30 %. (author)

Availability note (English)

Available online at http://sfm.asm.md/moldphys/

Additional details

Identifiers

Publishing Information

Journal Title
Moldavian Journal of the Physical Sciences
Journal Volume
11
Journal Issue
3
Journal Page Range
p. 222-228
ISSN
1810-648X

INIS

Country of Publication
Moldova, Republic of
Country of Input or Organization
Moldova, Republic of
INIS RN
44078570
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
COUPLING; ELECTRON-PHONON COUPLING; ENERGY LEVELS; EXCITED STATES; GROUND STATES; NANOSTRUCTURES; POLARONS; QUASI PARTICLES; SCREENING; SEMICONDUCTOR MATERIALS
Descriptors DEC
COUPLING; ENERGY LEVELS; MATERIALS; QUASI PARTICLES

Optional Information

Notes
10 refs., 4 figs.