An optimized three-dimensional linear-electric-field time-of-flight analyzer
- 1. University of Michigan, 2455 Hayward St., Ann Arbor, Michigan 48109-2143 (United States)
Description
In situ measurements of the dynamics and composition of space plasmas have greatly improved our understanding of the space environment. In particular, mass spectrometers that use a combination of electrostatic analyzers and time-of-flight systems can identify revealing dynamic and compositional characteristics of ions, and thus constrain their sources and the physical processes relevant for their transport. We demonstrate an optimized design of a linear-electric-field time-of-flight technology that can be used to obtain a high signal to noise: ions that follow an energy-isochronous oscillation within the instrument impact an emissive plate and cause secondary electrons to be sent toward the detector, triggering a high-resolution measurement. By focusing these secondary electrons to a central area on a position-sensitive anode, their signals are separated from ions and neutrals that do not experience energy-isochronous motion. Using their impact positions, the high mass resolution measurements are easily distinguished from other signals on the detector, leading to very favorable signal-to-noise ratios. This optimization provides an improvement to existing technologies without increasing the instrument size or complexity, and uses a novel time-of-flight circuit that combines timing and position information from many signals and ions.
Additional details
Identifiers
- DOI
- 10.1063/1.3429941;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 81
- Journal Issue
- 5
- Journal Page Range
- p. 053302-053302.8
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44013663
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANODES; CHARGED-PARTICLE TRANSPORT; DESIGN; ELECTRIC FIELDS; ELECTRON EMISSION; ELECTRONS; ELECTROSTATIC ANALYZERS; FOCUSING; IONS; MASS RESOLUTION; OPTIMIZATION; OSCILLATIONS; PLASMA; SIGNAL-TO-NOISE RATIO; THREE-DIMENSIONAL CALCULATIONS; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- BEAM ANALYZERS; CHARGED PARTICLES; DIMENSIONLESS NUMBERS; ELECTRODES; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; RADIATION TRANSPORT; RESOLUTION
Optional Information
- Notes
- (c) 2010 American Institute of Physics