Published October 2003
| Version v1
Miscellaneous
An analysis system for 10-15 order amount of elements, used combination of accelerator mass spectrometry (AMS) and particle induced x-ray emission (PIXE)
Creators
- 1. Tokyo Inst. of Technology, Research Laboratory for Nuclear Reactors, Tokyo (Japan)
Description
Usually AMS can be analyzed only an isotope element by a measurement, therefore we have attempted to analyze various isotope elements all at once. The new system is composed of the combination of AMS and PIXE. The new system apply data that is analyzed by PIXE analysis to AMS, thus, high-level detection around ppt - ppq (10-12 - 10-15) is able to measure. This system has two accelerators for AMS and PIXE. (author)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the fifth symposium on accelerator and related technology for application
- Imprint Pagination
- 98 p.
- Journal Page Range
- p. 5-8
Conference
- Title
- 5. symposium on accelerator and related technology for application
- Acronym
- ARTA 2003
- Dates
- 21-22 Oct 2003
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 41039219
- Subject category
- S43: PARTICLE ACCELERATORS; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ACCELERATORS; ACCURACY; BEAM ANALYZERS; CALIBRATION; DESIGN; ION SOURCES; MASS SPECTROSCOPY; MULTI-ELEMENT ANALYSIS; PIXE ANALYSIS; PLANNING; SPECIFICATIONS; TRACE AMOUNTS
- Descriptors DEC
- CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 9 refs., 3 tabs.