Published October 1, 2011 | Version v1
Journal article

Far infrared for decreasing surface radiation dose of phantom with EBT film dosimetry

  • 1. Institute of Radiological Science, Central Taiwan University of Science and Technology, Taichung, Taiwan (China)
  • 2. Department of Medical Imaging and Radiological Sciences, I-Shou University, Taiwan (China)
  • 3. Department of Radiation Oncology, E-Da Hospital, Kaohsiung, Taiwan (China)
  • 4. Department of Information Engineering, I-Shou University, Taiwan (China)
  • 5. Department of Medical Imaging and Radiology, Shu-Zen College of Medicine and Management, Taiwan (China)

Description

Purpose: The skin-sparing advantage of high-energy X-rays is degraded by secondary low energy electrons, which increase the surface dose and shift the position of the maximum dose towards the surface. Studies of mounting purging magnet and helium gas replacing air on the linear accelerator to sweep secondary electrons have been conducted and published. This study describes the amount of low energy electron contamination generated by a clinical photon beam from medical linear accelerator can be reduced by projecting specific wavelength (17,000 nm) of Far Infrared (FIR) to the irradiating area simultaneously. Specific wavelength of FIR can decrease the absorption of low energy contamination electrons in the build-up region.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2011.02.074

Additional details

Identifiers

DOI
10.1016/j.nima.2011.02.074;
PII
S0168-9002(11)00453-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
652
Journal Issue
1
Journal Page Range
p. 701-704
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
12. Symposium on radiation measurements and applications (SORMA)
Dates
24-28 May 2010
Place
Ann Arbor, MI (United States)

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.