Published 1975 | Version v1
Book

Charge state dependence of Si K x-ray production in solid and gaseous targets by 40 MeV oxygen ion impact

  • 1. Oak Ridge National Lab., TN

Description

The yield of silicon K x rays induced by 2.5-MeV/amu oxygen ions in gaseous (SiH4) and amorphous solid targets was studied. For a gas density 7.4 x 1014 cm-2 the yield increases approximately exponentially with the charge state q of the projectile in the region q = 6, 7, 8. A similar, but smaller, trend is found for a 7 μg/cm2 solid target. At this beam energy the most probable oxygen charge state emerging from a solid Si target is O7+. The x-ray yield from the solid is in accord with the emergent charge state. (U.S.)

Additional details

Publishing Information

Publisher
Plenum Publishing Corp.
Imprint Place
New York
Imprint Title
Atomic collisions in solids. Vol. 1
Imprint Pagination
p. 461-467.

Conference

Title
3. international conference on atomic collisions in solids.
Dates
23 Sep 1973.
Place
Gatlinburg, Tennessee, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
6207559
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COLLISIONS; ION COLLISIONS; ION-ATOM COLLISIONS; MEV RANGE 10-100; OXYGEN IONS; SILICON; X-RAY SPECTRA
Descriptors DEC
ATOM COLLISIONS; CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; IONS; MEV RANGE; SEMIMETALS; SPECTRA

Optional Information

Notes
Imprint:See CONF-730958--P1.