Published 1975
| Version v1
Book
Charge state dependence of Si K x-ray production in solid and gaseous targets by 40 MeV oxygen ion impact
- 1. Oak Ridge National Lab., TN
Description
The yield of silicon K x rays induced by 2.5-MeV/amu oxygen ions in gaseous (SiH4) and amorphous solid targets was studied. For a gas density 7.4 x 1014 cm-2 the yield increases approximately exponentially with the charge state q of the projectile in the region q = 6, 7, 8. A similar, but smaller, trend is found for a 7 μg/cm2 solid target. At this beam energy the most probable oxygen charge state emerging from a solid Si target is O7+. The x-ray yield from the solid is in accord with the emergent charge state. (U.S.)
Additional details
Publishing Information
- Publisher
- Plenum Publishing Corp.
- Imprint Place
- New York
- Imprint Title
- Atomic collisions in solids. Vol. 1
- Imprint Pagination
- p. 461-467.
Conference
- Title
- 3. international conference on atomic collisions in solids.
- Dates
- 23 Sep 1973.
- Place
- Gatlinburg, Tennessee, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 6207559
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COLLISIONS; ION COLLISIONS; ION-ATOM COLLISIONS; MEV RANGE 10-100; OXYGEN IONS; SILICON; X-RAY SPECTRA
- Descriptors DEC
- ATOM COLLISIONS; CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; IONS; MEV RANGE; SEMIMETALS; SPECTRA
Optional Information
- Notes
- Imprint:See CONF-730958--P1.