Published July 2004 | Version v1
Journal article Metadata-only

Silicon drift detector array for X-ray spectroscopy

Creators

  • 1. Southwestern Inst. of Physics, Chengdu (China)

Description

The silicon drift detector (SDD) used has the state of the art of high energy resolution and it can be operated in room temperature. The array of SDD will be used to measure the X-ray spectroscopy of the HL-2A Tokamak, including the parameters of plasma electron temperature profile, Zeff profile, concentration of metal impurities, and distribution of electron velocity. This is an advantageous of semi-conductor detector for diagnosis of fusion plasma. (authors)

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
24
Journal Issue
4
Journal Page Range
p. 331-334
ISSN
0258-0934

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
37050552
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ELECTRON TEMPERATURE; ENERGY RESOLUTION; HL-2A TOKAMAK; LI-DRIFTED SI DETECTORS; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; X-RAY SPECTROSCOPY
Descriptors DEC
CLOSED PLASMA DEVICES; IMPURITIES; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTROSCOPY; THERMONUCLEAR DEVICES; TOKAMAK DEVICES

Optional Information

Notes
5 figs., 3 refs.