Published April 2014
| Version v1
Journal article
The impact of growth parameters on trench defects in InGaN/GaN quantum wells
Creators
- 1. Department of Materials Science and Metallurgy, University of Cambridge (United Kingdom)
Description
The impact of the InGaN growth temperature and of the trimethylindium flux on trench defects has been investigated. We show that the density of defects is affected by both conditions but also their morphology and their emission properties. Therefore, the impact of such defect on the performance of quantum well structures can be controlled by adjusting these two growth conditions. Under usual conditions for making blue light emitting diodes, we observe that the enclosed region of the defect emits light at a longer wavelength. Nevertheless, our data also demonstrate that emission at a shorter wavelength is possible under certain growth conditions. (copyright 2014 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.201300485Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science
- Journal Volume
- 211
- Journal Issue
- 4
- Journal Page Range
- p. 740-743
- ISSN
- 1862-6300
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 45088140
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; CRYSTAL GROWTH; DEFECTS; GALLIUM NITRIDES; INDIUM NITRIDES; LIGHT EMITTING DIODES; MORPHOLOGY; ORGANOMETALLIC COMPOUNDS; PRECURSOR; QUANTUM WELLS; RED SHIFT; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0400-1000 K; VAPOR PHASE EPITAXY
- Descriptors DEC
- CORUNDUM; CRYSTAL GROWTH METHODS; ELECTRON MICROSCOPY; EMISSION; EPITAXY; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LUMINESCENCE; MICROSCOPY; MINERALS; NANOSTRUCTURES; NITRIDES; NITROGEN COMPOUNDS; ORGANIC COMPOUNDS; OXIDE MINERALS; PHOTON EMISSION; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TEMPERATURE RANGE