Published December 15, 2003 | Version v1
Journal article

Ion beam induced nanometric structure and oligopeptide adsorption on patterned polymer surfaces

Description

The adsorption process of the H-Arg-Gly-Asp-OH oligopeptide (RGD sequence) onto surfaces of poly(ethyleneterephtalate) and poly(caprolactone) patterned by 50 keV Ar+ ion beams is discussed. The irradiation through masks patterned with micrometric features was employed to create grooves and/or pits of nanometric depth. Both XPS and Imaging time-of-flight secondary-ion mass spectrometry (ToF-SIMS) measurements showed that incubation of the polymer samples with RGD solutions produces a preferential adsorption on the ion-irradiated areas of the PCL surfaces, while only a negligible adsorption is obtained onto PET. The adsorption behaviour of the RGD is found to correlate with the surface nanostructuring induced by the ion irradiation

Additional details

Identifiers

DOI
10.1016/j.msec.2003.09.095;
PII
S0928493103001826;

Publishing Information

Journal Title
Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
Journal Volume
23
Journal Issue
6-8
Journal Page Range
p. 779-786
ISSN
0928-4931

Conference

Title
Symposium A - Current trends in nanoscience - From materials to application
Acronym
E-MRS spring meeting 2003
Dates
9-13 Jun 2003
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38004259
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; ARGON IONS; ION BEAMS; ION MICROPROBE ANALYSIS; IRRADIATION; KEV RANGE 10-100; MASS SPECTROSCOPY; POLYMERS; SURFACES; TIME-OF-FLIGHT METHOD; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTRON SPECTROSCOPY; ENERGY RANGE; IONS; KEV RANGE; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; PHOTOELECTRON SPECTROSCOPY; SORPTION; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.