Published December 15, 2003
| Version v1
Journal article
Ion beam induced nanometric structure and oligopeptide adsorption on patterned polymer surfaces
Description
The adsorption process of the H-Arg-Gly-Asp-OH oligopeptide (RGD sequence) onto surfaces of poly(ethyleneterephtalate) and poly(caprolactone) patterned by 50 keV Ar+ ion beams is discussed. The irradiation through masks patterned with micrometric features was employed to create grooves and/or pits of nanometric depth. Both XPS and Imaging time-of-flight secondary-ion mass spectrometry (ToF-SIMS) measurements showed that incubation of the polymer samples with RGD solutions produces a preferential adsorption on the ion-irradiated areas of the PCL surfaces, while only a negligible adsorption is obtained onto PET. The adsorption behaviour of the RGD is found to correlate with the surface nanostructuring induced by the ion irradiation
Additional details
Identifiers
- DOI
- 10.1016/j.msec.2003.09.095;
- PII
- S0928493103001826;
Publishing Information
- Journal Title
- Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
- Journal Volume
- 23
- Journal Issue
- 6-8
- Journal Page Range
- p. 779-786
- ISSN
- 0928-4931
Conference
- Title
- Symposium A - Current trends in nanoscience - From materials to application
- Acronym
- E-MRS spring meeting 2003
- Dates
- 9-13 Jun 2003
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38004259
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADSORPTION; ARGON IONS; ION BEAMS; ION MICROPROBE ANALYSIS; IRRADIATION; KEV RANGE 10-100; MASS SPECTROSCOPY; POLYMERS; SURFACES; TIME-OF-FLIGHT METHOD; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTRON SPECTROSCOPY; ENERGY RANGE; IONS; KEV RANGE; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; PHOTOELECTRON SPECTROSCOPY; SORPTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.