Published December 1977
| Version v1
Journal article
Nonresonant detection of Josephson radiation from thin-film microbridges
Creators
- 1. Physics Laboratory I, The Technical University of Denmark, DK-2800 Lyngby, Denmark
Description
Measurements are reported of the Josephson radiation from microbridges coupled to an X-band receiver via a nonresonant microwave transformer. Although closely coupled to the bridge, the transformer does not modify the bridge properties. We find that near the transition temperature the radiation linewidth is proportional to the square of the dynamic resistance, which is also predicted by the resistively shunted junction model. The effective noise temperature determined by the linewidth is 19 +- 3 K and the measured maximum integral power is 5 x 10-12 W
Additional details
Identifiers
- DOI
- 10.1063/1.323542;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 48
- Journal Issue
- 12
- Series
- J. Appl. Phys.
- Journal Page Range
- 5372-5374
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 9374015
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC BRIDGES; FILMS; JOSEPHSON EFFECT; JOSEPHSON JUNCTIONS; MICROWAVE RADIATION; SUPERCONDUCTIVITY; TEMPERATURE NOISE; TRANSITION TEMPERATURE; WAVEGUIDES
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; NOISE; PHYSICAL PROPERTIES; RADIATIONS; SEMICONDUCTOR JUNCTIONS; THERMODYNAMIC PROPERTIES
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent