Rapid methods for multi-elemental X-ray fluorescence analysis using excitation isotope sources and Si(Li)-semiconductor detector

Some rapid methods using an unique calibration curve have been developed for multi-elemental X-ray fluorescence analysis of thin and thick layers of various samples having low contents of heavy elements. The matrix absorption effect in thick samples is taken into account according to the scattered radiation.The similar method using a unique calibration curve for determination of low contents of trace elements in thin layers without account of matrix effect is proposed. The results on the intercomposition run soil-5 are in good agreement with the data obtained in different laboratories. The errors of the method are 10 %; in a case of peak superposition - 15 %