Published July 25, 2003 | Version v1
Journal article

Characterisation of phase evolution under load by means of phase contrast imaging using synchrotron radiation

Description

Phase contrast radiography (PCR) is a quite novel technique that is collecting increasing attention due to the possibility to obtain image information in presence of very small differences in the densities of the materials under analysis. Phase contrast imaging (PCI) has some specific advantage when compared with common microscopic techniques: (a) no special preparation of the sample is needed (b) the simultaneously investigated area is very large and (c) it allows the setting up of complex experimental apparatus. The results here presented are a good evidence of these three advantages. In this paper, we report on the application of phase contrast imaging in the study of the phase evolution during pseudoelastic transformation in the NiTiCu shape memory alloys (SMAs). The investigation was undertaken with the aim to identify some modification of the structure taking place at the end of the transformation plateau in the pseudoelastic behaviour of the alloy

Additional details

Identifiers

DOI
10.1016/j.msea.2004.01.054;
PII
S092150930400228X;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
378
Journal Issue
1-2
Journal Page Range
p. 125-129
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
European symposium on martensitic transformation and shape-memory
Dates
17-22 Aug 2003
Place
Cirencester (United Kingdom)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37059893
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; DENSITY; IMAGES; MODIFICATIONS; SHAPE MEMORY EFFECT; SYNCHROTRON RADIATION; X RADIATION
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; PHYSICAL PROPERTIES; RADIATIONS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.