Published August 2010
| Version v1
Journal article
Design and characterization of 2.45 GHz electron cyclotron resonance plasma source with magnetron magnetic field configuration for high flux of hyperthermal neutral beam
- 1. Convergence Plasma Research Center, National Fusion Research Institute, Gwahangno 113, Yuseong-gu, Daejeon 305-333 (Korea, Republic of)
- 2. Department of Physics, Pohang University of Science and Technology, San 31, Hyoja-dong, Nam-gu, Pohang 790-784 (Korea, Republic of)
Description
A 2.45 GHz electron cyclotron resonance (ECR) source with a magnetron magnetic field configuration was developed to meet the demand of a hyperthermal neutral beam (HNB) flux on a substrate of more than 1x1015 cm-2 s-1 for industrial applications. The parameters of the operating pressure, ion density, electron temperature, and distance between the neutralization plate and the substrate for the HNB source are specified in a theoretical analysis. The electron temperature and the ion density are measured to characterize the ECR HNB source using a Langmuir probe and optical emission spectroscopy. The parameters of the ECR HNB source are in good agreement with the theoretically specified parameters.
Additional details
Identifiers
- DOI
- 10.1063/1.3477998;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 81
- Journal Issue
- 8
- Journal Page Range
- p. 083301-083301.6
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44016094
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DESIGN; ELECTRON CYCLOTRON-RESONANCE; ELECTRON TEMPERATURE; EMISSION SPECTROSCOPY; GHZ RANGE; ION DENSITY; LANGMUIR PROBE; MAGNETIC FIELD CONFIGURATIONS; MAGNETRONS; PARTICLE BEAMS; PLASMA; PLASMA PRODUCTION
- Descriptors DEC
- BEAMS; CYCLOTRON RESONANCE; ELECTRIC PROBES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PROBES; RESONANCE; SPECTROSCOPY
Optional Information
- Notes
- (c) 2010 American Institute of Physics