Analytical applications of positrons
Description
In using positrons as analytical tools the experimenter has two quite different options. The first and more obvious is to duplicate electron methods with positrons and see what differences (if any) result. The second is to exploit a unique characteristic of positrons, such as the formation and decay of the positronium atom, to study chemical composition and surface characteristics. Because positrons do not exist freely in our world, they must be obtained from radioactive sources or nuclear interactions. Source intensity has consequently been a limiting factor in experiments that attempt to duplicate electron applications. Some methods of producing and moderating positrons that have been developed here (and elsewhere) are described as well as results from studies using the sources. Surface measurements require less intense sources and yield useful data on materials such as xeolites, silica gels, graphite and alumina. Experimental apparatus, data and interpretation are discussed
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE85013627.Files
17005753.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- CONF-850657--1
Conference
- Title
- International symposium on nuclear analytical chemistry.
- Dates
- 5-7 Jun 1985.
- Place
- Halifax, Nova Scotia (Canada).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17005753
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; ELECTRON SPECTROMETERS; ELECTRON SPECTROSCOPY; GRAPHITE; POSITRON SOURCES; POSITRONIUM; POSITRONS; SCATTERING; SILICA GEL; SURFACE PROPERTIES; USES; ZEOLITES
- Descriptors DEC
- ADSORBENTS; ALUMINIUM COMPOUNDS; ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; CARBON; CHALCOGENIDES; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; INORGANIC ION EXCHANGERS; ION EXCHANGE MATERIALS; LEPTONS; MATERIALS; MATTER; MEASURING INSTRUMENTS; MINERALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE SOURCES; RADIATION SOURCES; SILICATE MINERALS; SPECTROMETERS; SPECTROSCOPY