Published June 2, 2008 | Version v1
Journal article

Linewidth measurement of Littrow structure semiconductor laser with improved methods

  • 1. CREAM Group, School of Electronics Engineering and Computer Science, Peking University, Beijing 100871 (China)

Description

In this Letter, the frequency noise spectrum is analyzed in the experiment of the laser linewidth measurement. The power spectrum of three most widely used laser linewidth measurement methods, i.e., the heterodyne measurement, the self-homodyne measurement and the self-heterodyne measurement, are restudied both theoretically and experimentally. A scheme adopting an avalanche photodetector (APD) in the delayed self-heterodyne (DSHT) method is proposed, and an indirect determined result is given

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2008.03.039

Additional details

Identifiers

DOI
10.1016/j.physleta.2008.03.039;
PII
S0375-9601(08)00498-2;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
372
Journal Issue
23
Journal Page Range
p. 4327-4332
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40046483
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
LINE WIDTHS; NOISE; PHOTODETECTORS; SEMICONDUCTOR LASERS; SPECTRA
Descriptors DEC
LASERS; SEMICONDUCTOR DEVICES; SOLID STATE LASERS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.