Published June 2, 2008
| Version v1
Journal article
Linewidth measurement of Littrow structure semiconductor laser with improved methods
Creators
- 1. CREAM Group, School of Electronics Engineering and Computer Science, Peking University, Beijing 100871 (China)
Description
In this Letter, the frequency noise spectrum is analyzed in the experiment of the laser linewidth measurement. The power spectrum of three most widely used laser linewidth measurement methods, i.e., the heterodyne measurement, the self-homodyne measurement and the self-heterodyne measurement, are restudied both theoretically and experimentally. A scheme adopting an avalanche photodetector (APD) in the delayed self-heterodyne (DSHT) method is proposed, and an indirect determined result is given
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2008.03.039Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2008.03.039;
- PII
- S0375-9601(08)00498-2;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 372
- Journal Issue
- 23
- Journal Page Range
- p. 4327-4332
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40046483
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- LINE WIDTHS; NOISE; PHOTODETECTORS; SEMICONDUCTOR LASERS; SPECTRA
- Descriptors DEC
- LASERS; SEMICONDUCTOR DEVICES; SOLID STATE LASERS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.