Cadmium telluride thin-film response for a laser beam illumination

The proposed optical system utilizes a 3 mm diameter Nd:YAG tunable laser which passes through the CdTe thin-film disk plate. Originating laser patterns are detected using CMOS camera, and the resolution of the laser pattern is analyzed with the help of well-defined quality criterion, the Full Width Half Maxima (FWHM). The differences between the responses of the system with and without the thin-film plate are compared. Finally, the optical output of the thin film for different visible wavelengths is found to be interesting to establish its field-controlling nature. The beam manipulation characteristics of the semiconducting element are determined, validating this element suitability for material processing.