Published 1986
| Version v1
Report
Programmable automated transistor test system
Description
The paper describes a programmable automated transistor test system (PATTS) and its utilization to evaluate bipolar transistors and Darlingtons, and such MOSFET and special types as can be accommodated with the PATTS base-drive. An application of a pulsed power technique at low duty cycles in a non-destructive test is used to examine the dynamic switching characteristic curves of power transistors. Data collection, manipulation, storage, and output are operator interactive but are guided and controlled by the system software. In addition a library of test data is established on disks, tapes, and hard copies for future reference
Additional details
Publishing Information
- Imprint Title
- Transactions of the symposia on space nuclear power systems. Summaries 1986
- Journal Page Range
- p. TE-5.1-TE-5.3.
- Report number
- CONF-860102--Summs
Conference
- Title
- 3. symposium on space nuclear power systems.
- Dates
- 13-16 Jan 1986.
- Place
- Albuquerque, NM (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18100035
- Subject category
- S42: ENGINEERING; S21: SPECIFIC NUCLEAR REACTORS AND ASSOCIATED PLANTS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DATA PROCESSING; MOSFET; POWER; SPACE POWER REACTORS; SPACECRAFT POWER SUPPLIES; SWITCHING CIRCUITS; TESTING; TRANSISTORS
- Descriptors DEC
- ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; FIELD EFFECT TRANSISTORS; MOBILE REACTORS; MOS TRANSISTORS; POWER REACTORS; POWER SUPPLIES; REACTORS; SEMICONDUCTOR DEVICES