Time-of-flight powder diffraction text experiments at a pulsed neutron beam using the position-sensitive detector JULIOS
- 1. Mineralogisches Inst., Univ. Bonn, Arbeitsgruppe Neutronenbeugung im Forschungszentrum Juelich, Bonn (Germany)
- 2. Rutherford Appleton Lab., Chilton (United Kingdom)
Description
Performance tests for a 'JULIOS TOF diffractometer' were performed in a short-term experimental setup at a pulsed neutron beam at ISIS. JULIOS is a linear position-sensitive scintillation detector constructed for simultaneous recording of time-of-flight and angular dispersive spectra. Data sets were recorded in 256 channels each for time and position and transformed afterwards to constant d spacing patterns. Diffraction spectra were measured using standard polycrystalline samples like Si, Cu, Ni and quartz under various experimental conditions. Results are discussed with respect to resolution and intensity. Δd/d resolution in forward scattering geometry is analysed to 6.5x10-3. Mean background in the detector is 4 counts per h and channel. The peak to background ratio for the strongest quartz reflection is about 22 to 1. The experimental setup was used for structural investigations on HoFe4+yAl8-y and IrO2; least squares refinements based on d-dependent integrated intensities are reported. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A
- Journal Volume
- 317
- Journal Issue
- 1/2
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 202-212
- ISSN
- 0168-9002
- CODEN
- NIMAE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 23088908
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM ALLOYS; BACKGROUND NOISE; COPPER; COUNTING RATES; CRYSTAL LATTICES; DATA PROCESSING; DEBYE-SCHERRER METHOD; EXPERIMENTAL DATA; HOLMIUM ALLOYS; IRIDIUM OXIDES; IRON ALLOYS; LATTICE PARAMETERS; LEAST SQUARE FIT; NEUTRON DETECTION; NEUTRON DETECTORS; NEUTRON DIFFRACTION; NEUTRON DIFFRACTOMETERS; NEUTRON SPECTRA; NICKEL; POLYCRYSTALS; POSITION SENSITIVE DETECTORS; PULSED NEUTRON TECHNIQUES; QUARTZ; SILICON; SILICON OXIDES; SOLID SCINTILLATION DETECTORS; SPATIAL RESOLUTION; TERNARY ALLOY SYSTEMS; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- ALLOY SYSTEMS; ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL STRUCTURE; CRYSTALS; DATA; DETECTION; DIFFRACTION; DIFFRACTION METHODS; DIFFRACTOMETERS; ELEMENTS; INFORMATION; IRIDIUM COMPOUNDS; MAXIMUM-LIKELIHOOD FIT; MEASURING INSTRUMENTS; METALS; MINERALS; NOISE; NUMERICAL DATA; NUMERICAL SOLUTION; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTION; RADIATION DETECTORS; RARE EARTH ALLOYS; RESOLUTION; SCATTERING; SCINTILLATION COUNTERS; SEMIMETALS; SILICON COMPOUNDS; SPECTRA; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS