Remanent multilayers for polarized neutron instrumentation
- 1. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
- 2. Forschungszentrum Juelich GmbH (Germany). Inst. fuer Festkoerperforschung
- 3. Hahn-Meitner-Institut Berlin GmbH (Germany)
Description
Polarizing multilayers and supermirrors for applications in neutron instrumentation have been produced using DC-magnetron sputtering. The chosen material combination Ti1-uNu-Fe0.50Co0.48V0.02 offers the possibility to adjust the scattering length density of the 'contrast' material Ti to the value being effective on neutrons in the /->-state in the FeCoV alloy magnetized to saturation, by loading Ti with the suited amount of nitrogen. Neutron reflectometry data for supermirrors give flipping ratios of 40 and more and reflectivities better than 85% at twice the critical angle of Ni. The production process induces a magnetic anisotropy for directions lying within the layer plane. Ti1-vGdv absorbing subcoatings have been used to suppress the remaining reflectivity of the unwanted spin component from the substrate-mirror interface. SQUID and MOKE magnetometry accompanied the experiments performed with polarized neutrons. (author) 8 figs., 18 refs
Additional details
Publishing Information
- Publisher
- Paul Scherrer Institut.
- Imprint Place
- Villigen (Switzerland)
- Imprint Title
- Proceedings of the meetings ICANS-XIII and ESS-PM4. Volume I
- Imprint Pagination
- 440 p.
- Series
- PSI-Proceedings 95-02.
- Journal Page Range
- p. 312-320.
- ISSN
- 1019-6447
- Report number
- INIS-mf--14816
Conference
- Title
- 13. meeting of the International Collaboration on Advanced Neutron Sources (ICANS-XIII); 4. plenary meeting of the European Spallation Source Project (ESS).
- Dates
- 11-14 Oct 1995; 16-19 Oct 1995.
- Place
- Villigen (Switzerland); Weinfelden (Switzerland).
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 27061046
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- EXPERIMENTAL DATA; LAYERS; MAGNETRONS; MEASURING INSTRUMENTS; MIRRORS; NEUTRONS; POLARIZED BEAMS; REFLECTIVITY; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BARYONS; BEAMS; DATA; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; HADRONS; INFORMATION; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NUCLEONS; NUMERICAL DATA; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SURFACE PROPERTIES