Published December 23, 2013
| Version v1
Journal article
Unexpected behaviour of one Pb monolayer deposited on aluminum oxide thin film grown on Ag(111)
Creators
- 1. IM2NP CNRS, Aix Marseille Université, F-13397 Marseille (France)
- 2. Institut des Sciences Moléculaires d'Orsay, ISMO CNRS, Université de Paris, F-91405 Orsay, France and Deptartamento de Physique, Université de Cergy-Pontoise, F-95031 Cergy-Pontoise (France)
- 3. CINaM CNRS, Aix Marseille Université, F-13288 Marseille (France)
Description
Using scanning tunneling microscopy (STM), Auger electron spectroscopy, and low energy electron diffraction, we have observed a surprising complete dissolution at room temperature of one lead monolayer deposited by evaporation on an aluminum oxide thin film (∼0.8 nm thick) previously grown on Ag (111). We have observed the quasi-instantaneous diffusion of the lead deposit through the oxide layer to the silver/oxide interface. After the diffusion process, lead atoms form a Moiré superstructure, which is characterized by STM through the oxide layer. This unexpected behavior puts in light the very weak interaction between the aluminum oxide and the silver substrate
Additional details
Identifiers
- DOI
- 10.1063/1.4855575;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 103
- Journal Issue
- 26
- Journal Page Range
- p. 261601-261601.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45074398
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; AUGER ELECTRON SPECTROSCOPY; DEPOSITS; ELECTRON DIFFRACTION; LEAD; SCANNING TUNNELING MICROSCOPY; SILVER; SILVER OXIDES; THIN FILMS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILVER COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC