Published June 1983
| Version v1
Journal article
Measuring device for plotting current voltage characteristics of Langmuir probes and determination of velocity distribution of electrons in low pressure plasma for microelectronic applications
Creators
- 1. Technische Hochschule, Karl-Marx-Stadt (German Democratic Republic). Sektion Physik/Elektronische Bauelemente
Description
A measuring device for the determination of plasma parameters, such as ion density, electron temperature, and plasma potential has been developed. The instrument is used for plotting current voltage characteristics of Langmuir probes and for determining the electron velocity distribution in low pressure plasma for microelectronic applications. Measurements in two different ion sources have been carried out in which the plasma is produced either by low pressure dc arc discharge (with glow cathode) or by hollow cathode glow discharge (without glow cathode)
Additional details
Additional titles
- Original title (German)
- Messgeraet zur Aufnahme von Sondenkennlinien und zur Bestimmung der Geschwindigkeitsverteilung der Elektronen in Niederdruckplasmen fuer mikroelektronische Anwendungen
Publishing Information
- Journal Title
- Wiss. Z. Tech. Hochsch. Karl-Marx-Stadt
- Journal Volume
- 25
- Journal Issue
- 6
- Series
- Wiss. Z. Tech. Hochsch. Karl-Marx-Stadt.
- Journal Page Range
- 915-924
- ISSN
- 0372-7610
INIS
- Country of Publication
- German Democratic Republic
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 16008012
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- BOLTZMANN STATISTICS; DATA ACQUISITION SYSTEMS; DATA PROCESSING; DISTRIBUTION FUNCTIONS; ELECTRIC ARCS; ELECTRIC CONDUCTIVITY; ELECTRON TEMPERATURE; ELECTRONIC EQUIPMENT; GLOW DISCHARGES; HOLLOW CATHODES; ION DENSITY; LANGMUIR PROBE; MEASURING INSTRUMENTS; PLASMA DIAGNOSTICS; POTENTIALS; SPECIFICATIONS; VELOCITY
- Descriptors DEC
- CATHODES; CURRENTS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC PROBES; ELECTRICAL PROPERTIES; ELECTRODES; EQUIPMENT; PHYSICAL PROPERTIES; PROBES